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Edward Yanowitz
USA Nominee Fine Art Professional "Grandmaster" EDWARD YANOWITZ was born May 25,1946 in Miami, Fl., raised in Nassau, Bahamas and Miami Beach, Fl. In 1972, he received a Masters of Fine Arts degree in Photography, from The San Francisco Art Institute, where he studied with Tony Ray-Jones, John Collier Jr., and Pirkle Jones. In 1974, four photographs were selected by John Szarkowski for the collection of The Museum of Modern Art, in New York City. In 1979, six photographs were chosen for a series of Christmas definitive postage stamps for the Bahamas, with an official first day cover. This was the first time photography or a local theme had ever been utilized. In 1992, He was retained as expert witness, documentary photographer, and coordinator of photography for the defense, in the William Kennedy Smith vs. the State of Florida trial. His photographs have been in numerous exhibitions and are held in corporate and private collections both nationally and internationally. |
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